Boolean satisfiability in electronic design automation
Proceedings of the 37th Annual Design Automation Conference
SAT based ATPG using fast justification and propagation in the implication graph
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Static logic implication with application to redundancy identification
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
SPIRIT: A Highly Robust Combinational Test Generation Algorithm
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Combinational test generation using satisfiability
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper, we present a new data structure for a complete implication graph and two techniques for low complexity static learning. We show that using static indirect &Lgr-implications and super gate extraction some hard-to-detect static and dynamic indirect implications are easily derived during static and dynamic learning as well as branch and bound search. Experimental results demonstrated the effectiveness of the proposed data structure and learning techniques.