SPIRIT: A Highly Robust Combinational Test Generation Algorithm

Authors:
Emil Gizdarski;Hideo Fujiwara
Affiliations:
-;-
Venue:
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Year:
2001

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Abstract

In this paper, we present a robust test generation algorithm for combinational circuits based on the Boolean satisfiability method called SPIRIT. We elaborate some well-known techniques as well as present new techniques that improve the performance and robustness of test generation algorithms. As a result, SPIRIT achieves 100% fault efficiency for a full scan version of the ITC'99 benchmark circuits in a reasonable amount of time.