A comment on “a fast parallel algorithm for thinning digital patterns”
Communications of the ACM - The MIT Press scientific computation series
An improved parallel thinning algorithm
Communications of the ACM
IEEE Transactions on Pattern Analysis and Machine Intelligence
CST: A fast thinning algorithm implemented on a sequential computer
IEEE Transactions on Systems, Man and Cybernetics
Sequential Operations in Digital Picture Processing
Journal of the ACM (JACM)
Some Parallel Thinning Algorithms for Digital Pictures
Journal of the ACM (JACM)
Concurrent Programming Concepts
ACM Computing Surveys (CSUR)
A fast parallel algorithm for thinning digital patterns
Communications of the ACM
Computer representation of planar regions by their skeletons
Communications of the ACM
Algorithms for Graphics and Imag
Algorithms for Graphics and Imag
A flexible thinning algorithm allowing parallel, sequential, and distributed application
ACM Transactions on Mathematical Software (TOMS)
Thinning Methodologies-A Comprehensive Survey
IEEE Transactions on Pattern Analysis and Machine Intelligence
A noniterative thinning algorithm
ACM Transactions on Mathematical Software (TOMS)
Veinerization: A New Shape Description for Flexible Skeletonization
IEEE Transactions on Pattern Analysis and Machine Intelligence
Skeletonization on Orojection Pictures
CAIP '99 Proceedings of the 8th International Conference on Computer Analysis of Images and Patterns
An Order---Independent Sequential Thinning Algorithm
IWCIA '09 Proceedings of the 13th International Workshop on Combinatorial Image Analysis
Thinning algorithms based on quadtree and octree representations
Information Sciences: an International Journal
Skeleton simplification by key points identification
MCPR'10 Proceedings of the 2nd Mexican conference on Pattern recognition: Advances in pattern recognition
Journal of Computer Science and Technology
Sufficient conditions for order-independency in sequential thinning
Acta Cybernetica
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A new contour generating serial algorithm is faster and more efficient than conventional contour tracing and parallel algorithms