Efficient Coverage Mask Generation for Antialiasing

  • Authors:
  • Marcus D. Waller;Jon P. Ewins;Martin White;Paul F. Lister

  • Affiliations:
  • -;-;-;-

  • Venue:
  • IEEE Computer Graphics and Applications
  • Year:
  • 2000

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Abstract

The authors present a novel and efficient approach to coverage mask antialiasing that enables the use of higher mask resolutions for improved image quality.