A knowledge based system for selecting a test methodology for a PLA
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
The ADAM advanced design automation system: overview, planner and natural language interface
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
Analysis of Testable PLA Designs
IEEE Design & Test
Tackling cost optimization in testable design by forward inferencing
EURO-DAC '92 Proceedings of the conference on European design automation
Exploring Test Space with Fuzzy Decision Making
IEEE Design & Test
Generation of embedded RAMs with built-in test using object-oriented programming
EURO-DAC '90 Proceedings of the conference on European design automation
Design for testability reuse in synthesis for testability
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
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A prototype knowledge-based system that helps select test methodologies for a particular type of logic structure is described. The system, called TDES, (testable design expert system), is a subsystem of Adam, an advanced design automation system. The system is being used to test programmable logic arrays, but its architecture is applicable to other types of structures such as RAMs, ROMs, and other combinational logic. It uses a divide-and-conquer (partitioning) strategy and works interactively with a user as an intelligent consultant and assistant.