DFT Expert: Designing Testable VLSI Circuits

  • Authors:
  • Sudipta Bhawmik;P. Palchaudhuri

  • Affiliations:
  • -;-

  • Venue:
  • IEEE Design & Test
  • Year:
  • 1989

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Abstract

A set of expert-system modules for designing easily testable VLSI circuits called DFT Expert is described. DFT Expert operates at the register-transfer level of circuit description, classifying circuit components into data transporters (DTs) and data processors (DPs). It identifies DPs and DTs, selects a test method, configures global design for test (DFT), and generates test schedules. DFT Expert's ability to test a practical circuit is demonstrated.