Probability and Statistics with Reliability, Queuing and Computer Science Applications
Probability and Statistics with Reliability, Queuing and Computer Science Applications
Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems
Journal of Electronic Testing: Theory and Applications
Defect-oriented test quality assessment using fault sampling and simulation
ITC '98 Proceedings of the 1998 IEEE International Test Conference
13.2 Sampling Techniques of Non-Equally Probable Faults in VLSI Systems
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
REGISTER-TRANSFER LEVEL FAULT MODELING AND TEST EVALUATION TECHNIQUES FOR VLSI CIRCUITS
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A probabilistic analysis of coverage methods
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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In the text, Test Generation for VLSI Chips (see IEEE Computer Society Press, 1988), V. Agrawal and S. Seth gave a formula for estimating fault coverage from the coverage analysis of randomly sampled faults that contains an error. A corrected formula for the sample size required for a given error tolerance in the measurement of fault coverage is given. Easy-to-use guidelines for analyzing fault coverage are presented.