Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Performance of signature analysis: a survey of bounds, exact, and heuristic algorithms
Integration, the VLSI Journal
Single-Reference Multiple Intermediate Signature (SREMIS) Analysis for BIST
IEEE Transactions on Computers
Built-in Self Test Based on Multiple On-Chip Signature Checking
Journal of Electronic Testing: Theory and Applications
Single-Reference Multiple Intermediate Signature (SREMIS) Analysis for BIST
IEEE Transactions on Computers
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This paper proposes a novel multiple signature analysis approach called Fuzzy Multiple Signature (FMS) analysis. Conventionally, for a circuit to be declared good, each signature from the circuit under test (CUT) must correspond to a specific reference, which makes multiple signature analysis complex and silicon-inefficient. In the FMS scheme the aforementioned one-to-one correspondence is not required. For a CUT to be declared good in this scheme, it suffices that each signature correspond to any element from a reference set. This paper includes an aliasing model, an implementation description and experimental results on fault coverage enhancement and fault simulation time savings.