Strategies for Low-Cost Test

Authors:
Rohit Kapur;R. Chandramouli;T. W. Williams
Affiliations:
-;-;-
Venue:
IEEE Design & Test
Year:
2001

Citing 2
Cited 2

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Abstract

More collaboration between EDA, semiconductor, and ATE industry segments can improve the manufacturing test environment. These improvements can dramatically reduce the cost of test and lead to a new generation of DFT-aware ATE and ATE-aware DTE.