Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy

Authors:
Ho Fai Ko;Nicola Nicolici
Affiliations:
Department of Electrical and Computer Engineering, McMaster University, Hamilton, Canada L8S 4K1;Department of Electrical and Computer Engineering, McMaster University, Hamilton, Canada L8S 4K1
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2008

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Abstract

This paper discusses an automated method to divide scan chains into multiple scan segments that are suitable for power-constrained at-speed testing using the skewed-load test application strategy. By dividing a circuit into multiple partitions, which can be tested independently, both power during shift and power during capture can be controlled. Despite activating one partition at a time, we show how through conscious construction of scan segments, high transition fault coverage can be achieved, while reducing test time of the circuit and employing third party test generation tools.