Enhancing Delay Fault Coverage through Low Power Segmented Scan

Authors:
Zhuo Zhang;Sudhakar M. Reddy;Irith Pomeranz2, Pomeranz;Janusz Rajski;Bashir M. Al-Hashimi
Affiliations:
University of Iowa, USA;University of Iowa, USA;Purdue University, USA;Mentor Graphics Corp., USA;University of Southampton, UK
Venue:
ETS '06 Proceedings of the Eleventh IEEE European Test Symposium
Year:
2006

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Abstract

Most scan based designs implement the scan enable as a slow speed global control signal, and can therefore only implement launch-on-capture (LOC) delay tests. Launch-onshift (LOS) tests are generally more effective, achieving higher fault coverage with ...