Scan latch partitioning into multiple scan chains for power minimization in full scan sequential circuits

Authors:
Nicola Nicolici;Bashir M. Al-Hashimi
Affiliations:
Electronic Systems Design Group, Department of Electronics and Computer Science, University of Southampton, Southampton SO17 1BJ, UK;Electronic Systems Design Group, Department of Electronics and Computer Science, University of Southampton, Southampton SO17 1BJ, UK
Venue:
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Year:
2000

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Abstract