DATE '00 Proceedings of the conference on Design, automation and test in Europe
Minimized Power Consumption for Scan-Based BIST
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
An integrated system-on-chip test framework
Proceedings of the conference on Design, automation and test in Europe
Combining low-power scan testing and test data compression for system-on-a-chip
Proceedings of the 38th annual Design Automation Conference
Minimizing concurrent test time in SoC's by balancing resource usage
Proceedings of the 12th ACM Great Lakes symposium on VLSI
Proceedings of the 39th annual Design Automation Conference
The design and optimization of SOC test solutions
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
An Integrated Framework for the Design and Optimization of SOC Test Solutions
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Proceedings of the 40th annual Design Automation Conference
Optimization of Test Accesses with a Combined BIST and External Test Scheme
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Low-Energy BIST Design for Scan-based Logic Circuits
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Power Conscious Test Synthesis and Scheduling for BIST RTL Data Paths
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A Comparison of Classical Scheduling Approaches in Power-Constrained Block-Test Scheduling
ITC '00 Proceedings of the 2000 IEEE International Test Conference
ITC '01 Proceedings of the 2001 IEEE International Test Conference
An Analysis of Powe Reduction Techniques in Scan Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
RSP '01 Proceedings of the 12th International Workshop on Rapid System Prototyping
Minimized Power Consumption For Scan-Based Bist
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Power-Conscious Test Synthesis and Scheduling
IEEE Design & Test
IEEE Transactions on Computers
A Graph-Based Approach to Power-Constrained SOC Test Scheduling
Journal of Electronic Testing: Theory and Applications
Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power Constraints
Journal of Electronic Testing: Theory and Applications
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor
Journal of Electronic Testing: Theory and Applications
SoC Test Scheduling with Power-Time Tradeoff and Hot Spot Avoidance
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Testability Trade-Offs for BIST Data Paths
Journal of Electronic Testing: Theory and Applications
Rapid Generation of Thermal-Safe Test Schedules
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
FITS: An Integrated ILP-Based Test Scheduling Environment
IEEE Transactions on Computers
Power-Aware Test Planning in the Early System-on-Chip Design Exploration Process
IEEE Transactions on Computers
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Multiple-constraint driven system-on-chip test time optimization
Journal of Electronic Testing: Theory and Applications
A critical-path-aware partial gating approach for test power reduction
ACM Transactions on Design Automation of Electronic Systems (TODAES)
New test data decompressor for low power applications
Proceedings of the 44th annual Design Automation Conference
Empirical Validation of Yield Recovery Using Idle-Cycle Insertion
IEEE Design & Test
A System-layer Infrastructure for SoC Diagnosis
Journal of Electronic Testing: Theory and Applications
A BIST TPG for low power dissipation and high fault coverage
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
Journal of Electronic Testing: Theory and Applications
Power-aware SoC test planning for effective utilization of port-scalable testers
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling
Journal of Electronic Testing: Theory and Applications
On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time
IEICE - Transactions on Information and Systems
Test time minimization for hybrid BIST of core-based systems
Journal of Computer Science and Technology
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Low-power scan operation in test compression environment
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Graph theoretic approach for scan cell reordering to minimize peak shift power
Proceedings of the 20th symposium on Great lakes symposium on VLSI
X-filling for simultaneous shift- and capture-power reduction in at-speed scan-based testing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
SOC test planning using virtual test access architectures
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
EUC'06 Proceedings of the 2006 international conference on Embedded and Ubiquitous Computing
Scheduling Tests for 3D Stacked Chips under Power Constraints
Journal of Electronic Testing: Theory and Applications
Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.01 |
This paper considers the problem of testing VLSI integrated circuits in minimum time without exceeding their power ratings during test. We use a resource graph formulation for the test problem. The solution requires finding a power-constrained schedule of tests. Two formulations of this problem are given as follows: (1) scheduling equal length tests with power constraints and (2) scheduling unequal length tests with power constraints. Optimum solutions are obtained for both formulations. Algorithms consist of four basic steps. First, a test compatibility graph is constructed from the resource graph. Second, the test compatibility graph is used to identify a complete set of time compatible tests with power dissipation information associated with each test. Third, from the set of compatible tests, lists of power compatible tests are extracted. Finally, a minimum cover table approach is used to find an optimum schedule of power compatible tests.