An Analysis of Powe Reduction Techniques in Scan Testing

Authors:
Jayashree Saxena;Kenneth M. Butler;Lee Whetsel
Affiliations:
-;-;-
Venue:
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Year:
2001

Citing 9
Cited 0

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Abstract

Power consumption during scan testing is becoming a concern. Circuit switching activity during scanshifting is high and results in high average and instantaneous power consumption. This paper presentsa scheme for reducing power and provides analysis results on an industrial design.