DAC '96 Proceedings of the 33rd annual Design Automation Conference
Event propagation conditions in circuit delay computation
ACM Transactions on Design Automation of Electronic Systems (TODAES)
AFTA: a formal delay model for functional thinking analysis
Proceedings of the conference on Design, automation and test in Europe
Signal Delay in Coupled, Distributed RC Lines in the Presence of Temporal Proximity
ARVLSI '97 Proceedings of the 17th Conference on Advanced Research in VLSI (ARVLSI '97)
Accurate timing analysis using SAT and pattern-dependent delay models
Proceedings of the conference on Design, automation and test in Europe
Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems
Journal of Electronic Testing: Theory and Applications
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