Kazuo Iwama;Hidetoshi Abeta;Eiji Miyano
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Random generation of test instances for logic optimizers
DAC '94 Proceedings of the 31st annual Design Automation Conference
Effective use of boolean satisfiability procedures in the formal verification of superscalar and VLIW
Proceedings of the 38th annual Design Automation Conference
Effective use of boolean satisfiability procedures in the formal verification of superscalar and VLIW microprocessors
Journal of Symbolic Computation