Testing configurable LUT-based FPGA's
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Rothko: A Three-Dimensional FPGA
IEEE Design & Test
Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!)
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Test of RAM-based FPGA: methodology and application to the interconnect
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
FPL '02 Proceedings of the Reconfigurable Computing Is Going Mainstream, 12th International Conference on Field-Programmable Logic and Applications
On the Set of Target Path Delay Faults in Sequential Subcircuits of LUT-based FPGAs
FPL '02 Proceedings of the Reconfigurable Computing Is Going Mainstream, 12th International Conference on Field-Programmable Logic and Applications
Hi-index | 0.00 |
We present an extension of a procedure for self-testing of an FPGA that implements a user-defined function. This extension, intended to improve the detectability of FPGA delay faults, exploits the reconfigurability of FPGAs and is based on modifying the functions of LUTs in the section under test. A modification procedure replaces a user-defined function of each LUT with a specific function that preserves the blocking capability and input-output transition pattern of the original function. We show that the proposed method significantly increases the susceptibility of FPGA delay faults to random testing.