Intrinsic response for analog module testing using an analog testability bus
ACM Transactions on Design Automation of Electronic Systems (TODAES)
IEEE P1149.4 - ALMOST A STANDARD
ITC '97 Proceedings of the 1997 IEEE International Test Conference
desire to reduce (or eliminate) complex and in P1149.4 Environment
ITC '97 Proceedings of the 1997 IEEE International Test Conference
The Integration of Boundary-Scan Test Methods to A Mixed-Signal Environment
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Embedded System Level Self-Test for Mixed-Signal IO Verification
Journal of Electronic Testing: Theory and Applications
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
An IEEE 1149.1-based BIST method for at-speed testing of inter-switch links in network on chip
Microelectronics Journal
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