Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
ITC '98 Proceedings of the 1998 IEEE International Test Conference
The application of novel Failure Analysis Techniques for Advanced Multi-layered CMOS devices
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '98 Proceedings of the 1998 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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