Towards the logic defect diagnosis for partial-scan designs
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
A Symbolic Inject-and-Evaluate Paradigm for Byzantine Fault Diagnosis
Journal of Electronic Testing: Theory and Applications
FAULT MODEL EXTENSION FOR DIAGNOSING CUSTOM CELL FAILS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '98 Proceedings of the 1998 IEEE International Test Conference
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