Minimizing Test Time by Exploiting Parallelism in Macro Test

• Authors:

• Hans Bouwmeester;Steven Oostdijk;Frank Bouwman;Rudi Stans;Loek Thijssen;Frans P. M. Beenker

• Affiliations:

• -;-;-;-;-;-

• Venue:
• Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
• Year:
• 1993