A New Approach to Test Generation and Test Compaction for Scan Circuits
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Reduced Test Application Time Based on Reachability Analysis
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Test compaction for transition faults under transparent-scan
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Reducing the switching activity of test sequences under transparent-scan
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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