Built-in clock skew system for on-line debug and repair
Proceedings of the conference on Design, automation and test in Europe
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Built-in sensor for signal integrity faults in digital interconnect signals
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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