Electronic Circuit & System Simulation Methods (SRE)
Electronic Circuit & System Simulation Methods (SRE)
Equivalent Elmore delay for RLC trees
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient linear circuit analysis by Pade approximation via the Lanczos process
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Modeling skin and proximity effects with reduced realizable RL circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Structure preserving reduction of frequency-dependent interconnect
Proceedings of the 42nd annual Design Automation Conference
Design and verification of high-speed VLSI physical design
Journal of Computer Science and Technology
Stable parallelizable model order reduction for circuits with frequency-dependent elements
IEEE Transactions on Circuits and Systems Part I: Regular Papers
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Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC network when skin effect is significant, which complicates interconnect simulation. In this paper, a new type of moments is defined that simplifies the interconnect simulation, namely, the square root moments. The time to calculate the square root moments is similar to the time to calculate the traditional moments, and the new moments preserve the recursive properties of the traditional moments. Hence, the method introduced here can handle the more complex problem of interconnect simulation with skin effect at almost no overhead compared to constant element interconnect simulation. Using the square root moments, higher order approximations can be reached as compared to traditional moments. Also, the PVL method is modified to implicitly match the square root moments. The simulation results reveal the high accuracy of the proposed methods as well as the apparent variation in the signal characteristics caused by skin effect.