Timing Measurements of Synchronization Circuits
ASYNC '03 Proceedings of the 9th International Symposium on Asynchronous Circuits and Systems
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A jitter characterization system using a component-invariant vernier delay line
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Novel Formalism for Partially Defined Asynchronous Feedback Digital Circuits
Journal of Electronic Testing: Theory and Applications
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Determining metastability characteristics is challenging. Devising reliable and repeatable experiments and procedures requires time, patience, care and knowledge. This discussion presents practical measurement techniques to accurately determine the Resolving Time Constant (tau) and Metastability Window (W). Also included is a method for observing the metastability failure rate at a designated time following the Clock. By converting this failure rate to observed MTBF (Mean Time Between Failure), a comparison is made to a predicted MTBF.