Verifying real-time properties of MOS-transistor circuits

  • Authors:
  • J. Frossl;T. Kropf

  • Affiliations:
  • Institut für Rechnerentwurf und Fehlertoleranz (Prof. D. Schmid), Universität Karlsruhe, Karlstraβe 12, 76128 Karlsruhe, Germany;Institut für Rechnerentwurf und Fehlertoleranz (Prof. D. Schmid), Universität Karlsruhe, Karlstraβe 12, 76128 Karlsruhe, Germany

  • Venue:
  • EDTC '95 Proceedings of the 1995 European conference on Design and Test
  • Year:
  • 1995

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Abstract

A verification approach which allows the verification of functional and timing behavior of circuits at transistor level is presented. It is aimed at the verification of asynchronous interfaces and standard-cell library modules. In contrast to other approaches, timing is explicitly considered, allowing one to verify timing-dependent effects with a high degree of accuracy. To conveniently specify desired properties, a specification language based on Linear Quantized Temporal Logic (QLTL) is provided. For an efficient verification, input constraints, necessary for a proper circuit functioning, are converted into input constraining automata, reducing the reachable state space and providing a model linearisation, necessary to prove linear QLTL formulas by branching CTL model checking.