Synthesis for testability: circuits derived from ordered Kronecker functional decision diagrams

Authors:
B. Becker;R. Drechsler
Affiliations:
Comp. SC. Dept., J.W.Goethe-University, D-60054 Frankfurt am Main, Germany;Comp. SC. Dept., J.W.Goethe-University, D-60054 Frankfurt am Main, Germany
Venue:
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Year:
1995

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Abstract

Summary form only given. Testability properties of circuits derived from Ordered Kronecker Functional Decision Diagrams (OKFDDs) are studied with respect to the Stuck-At Fault Model (SAFM) and the Cellular Fault Model (CFM). The computation of complete test sets and of all occurring redundancies can be done easily and efficiently and circuits with high testability can be obtained.