Random Benchmark Circuits with Controlled Attributes

  • Authors:
  • Kazuo Iwama;Sunao Sawada;Kensuke Hino;Hiroyuki Kurokawa

  • Affiliations:
  • Dept of Computer Science and Communication Engineering, Kyushu University, Japan;Dept of Computer Science and Communication Engineering, Kyushu University, Japan;Industria1 Instrumentation & Control Systems Department, TOSHIBA Corporation, Japan;Research & Development, JUSTSYSTEM Corporation, Japan

  • Venue:
  • EDTC '97 Proceedings of the 1997 European conference on Design and Test
  • Year:
  • 1997

Quantified Score

Hi-index 0.00

Visualization

Abstract

Two major improvements, controlled fan-in and automated initial-circuit production, were made over the random generator of benchmark circuits presented at DAC'94. This is an important progress towards our goal of random benchmarking: more general and secure testing, increasing the naturality of random circuits by controlling their attributes, and obtaining test results by which the difference of performances under evaluation can be made clear.