Introduction to an LSI test system
DAC '77 Proceedings of the 14th Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Automatic checking of logic design structures For compliance with testability ground rules
DAC '77 Proceedings of the 14th Design Automation Conference
Test generation for large logic networks
DAC '77 Proceedings of the 14th Design Automation Conference
Test data verification - not just the final step for test data before release for production testing
DAC '81 Proceedings of the 18th Design Automation Conference
Structured trace diagnosis for LSSD board testing—an alternative to full fault simulated diagnosis
DAC '81 Proceedings of the 18th Design Automation Conference
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This paper analyzes a test methodology for large logic networks. In particular, it examines the effects of network sub-division on test system performance.