A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Automatic checking of logic design structures For compliance with testability ground rules
DAC '77 Proceedings of the 14th Design Automation Conference
Test generation for large logic networks
DAC '77 Proceedings of the 14th Design Automation Conference
DAC '77 Proceedings of the 14th Design Automation Conference
DAC '77 Proceedings of the 14th Design Automation Conference
Test generation for scan design circuits with tri-state modules and bidirectional terminals
DAC '83 Proceedings of the 20th Design Automation Conference
Test data verification - not just the final step for test data before release for production testing
DAC '81 Proceedings of the 18th Design Automation Conference
A test methodology for large logic networks
DAC '78 Proceedings of the 15th Design Automation Conference
Selective controllability: A proposal for testing and diagnosis
DAC '78 Proceedings of the 15th Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Automatic checking of logic design structures For compliance with testability ground rules
DAC '77 Proceedings of the 14th Design Automation Conference
Test generation for large logic networks
DAC '77 Proceedings of the 14th Design Automation Conference
DAC '77 Proceedings of the 14th Design Automation Conference
DAC '77 Proceedings of the 14th Design Automation Conference
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Within the IBM Corporation, the use of LSI technology has brought a need for new methods of generating logic tests. This paper outlines the major problems in testing LSI networks, and the principal considerations that have led to an integrated technical solution.