Test and Debug Strategy of the PNX8525 Nexperia" Digital Video Platform System Chip
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips
Journal of Electronic Testing: Theory and Applications
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Transaction-Based Communication-Centric Debug
NOCS '07 Proceedings of the First International Symposium on Networks-on-Chip
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For today's multi-million transistor ICs, existing design verification techniques cannot guarantee that first silicon is designed error free. Because of this reality, there is a need for a good debug methodology. This paper describes the application of a generic silicon debug methodology to a modular video-processing chip called co-processor array (CPA). The debug hardware, which was added to the design, and the supporting debugger software are described. The application of the added debug functionality and its effectiveness during first silicon bring-up are also presented.