Proceedings of the conference on Design, automation and test in Europe - Volume 1
Emerging challenges in designing secure mobile appliances
Ambient intelligence
A random perturbation-based scheme for pairwise key establishment in sensor networks
Proceedings of the 8th ACM international symposium on Mobile ad hoc networking and computing
A random perturbation-based scheme for pairwise key establishment in sensor networks
Proceedings of the 8th ACM international symposium on Mobile ad hoc networking and computing
Reconfigurable trusted computing in hardware
Proceedings of the 2007 ACM workshop on Scalable trusted computing
CARDIS '08 Proceedings of the 8th IFIP WG 8.8/11.2 international conference on Smart Card Research and Advanced Applications
An one-way function based framework for pairwise key establishment in sensor networks
International Journal of Security and Networks
Memory Leakage-Resilient Encryption Based on Physically Unclonable Functions
ASIACRYPT '09 Proceedings of the 15th International Conference on the Theory and Application of Cryptology and Information Security: Advances in Cryptology
PRINTcipher: a block cipher for IC-printing
CHES'10 Proceedings of the 12th international conference on Cryptographic hardware and embedded systems
SCN'10 Proceedings of the 7th international conference on Security and cryptography for networks
Optically enhanced position-locked power analysis
CHES'06 Proceedings of the 8th international conference on Cryptographic Hardware and Embedded Systems
A comparative cost/security analysis of fault attack countermeasures
FDTC'06 Proceedings of the Third international conference on Fault Diagnosis and Tolerance in Cryptography
Invariance-based concurrent error detection for advanced encryption standard
Proceedings of the 49th Annual Design Automation Conference
Secure multipliers resilient to strong fault-injection attacks using multilinear arithmetic codes
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper explains a new family of techniques to extract data from semiconductormemory, without using the read-out circuitryprovided for the purpose. What these techniques have in common is the use of semi-invasive probing methods to induce measurable changes in the analogue characteristics ofthe memory cells of interest. The basic ideais that when a memory cell, or read-out amplifier, is scanned appropriately with a laser,the resulting increase in leakage current depends on its state; the same happens whenwe induce an eddy current in a cell. Theseperturbations can be carried out at a levelthat does not modify the stored value, butstill enables it to be read out. Our techniques build on a number of recent advancesin semi-invasive attack techniques [1], lowtemperature data remanence [2,3], electromagnetic analysis [4] and eddy current induction [5]. They can be used against a widerange of memory structures, from registersthrough RAM to FLASH. We have demonstrated their practicality by reading out DESkeys stored in RAM without using the normalread-out circuits. This suggests that vendorsof products such as smartcards and securemicrocontrollers should review their memoryencryption, access control and other storagesecurity issues with care.