Multistage Interconnection Network Reliability
IEEE Transactions on Computers
Assessing Reliability of Multistage Interconnection Networks
IEEE Transactions on Computers
Dependability Assessment Using Binary Decision Diagrams (BDDs)
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Dependability analysis of fault-tolerant systems: a new look at combinatorial modeling
Dependability analysis of fault-tolerant systems: a new look at combinatorial modeling
The Extra Stage Cube: A Fault-Tolerant Interconnection Network for Supersystems
IEEE Transactions on Computers
Performance of Processor-Memory Interconnections for Multiprocessors
IEEE Transactions on Computers
A Survey of Interconnection Networks
Computer
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The authors use the BDD to help derive a closed-form solution for the reliability of a multistage interconnection network with n stages. The BDD reveals repeated structures, the reliability of which can be encoded in a recursive formula. An exact solution of a network with an arbitrary number of stages can be computed in time proportional to the number of stages. They also provide results which include the concept of imperfect coverage, in which two mutually-exclusive failure modes (with different effects) are possible for certain switching elements.