Automatic Test Program Generation: A Case Study
IEEE Design & Test
Code Generation for Functional Validation of Pipelined Microprocessors
Journal of Electronic Testing: Theory and Applications
A full lifecycle performance verification methodology for multicore systems-on-chip
ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on verification challenges in the concurrent world
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We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of the validation problem: (a) verifying the functional integrip of the model and (b) testing the model for timing accuracy at the architectural level. The latter area, that of performance verification, is of increasing importance in the design of server-class processor chips, with one or more high performance cores on a single die. We show how simulation-based test cases can be generated under a unified defect and coverage model to detect both performance and functional bugs. We present and discuss examples of such integrated validation methodologies used in real processor development projects.