Application of Arithmetic Coding to Compression of VLSI Test Data
IEEE Transactions on Computers
Data-Independent Pattern Run-Length Compression for Testing Embedded Cores in SoCs
IEEE Transactions on Computers
Test data compression based on geometric shapes
Computers and Electrical Engineering
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Localized delay defects, like resistive shorts, resistiveopens, etc., can be effectively detected by testing the longesttestable path through each wire (or gate) in the circuit. Sucha delay test set is referred to as a longest-path-per-wire testset. ...