Proceedings of the 40th annual Design Automation Conference
A design-for-digital-testability circuit structure for Σ-Δ modulators
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Built-in-Self-Test Σ-Δ ADC Prototype
Journal of Electronic Testing: Theory and Applications
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Localized delay defects, like resistive shorts, resistiveopens, etc., can be effectively detected by testing the longesttestable path through each wire (or gate) in the circuit. Sucha delay test set is referred to as a longest-path-per-wire testset. ...