Group Properties of Cellular Automata and VLSI Applications
IEEE Transactions on Computers
Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Parallel Random Number Generation for VLSI Systems Using Cellular Automata
IEEE Transactions on Computers
Primitive polynomials of degree 301 through 500
Journal of Electronic Testing: Theory and Applications
A class of two-dimensional cellular automata and their applications in random pattern testing
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Shift Register Sequences
ScanBist: A Multifrequency Scan-Based BIST Method
IEEE Design & Test
Two-Pattern Test Capabilities of Autonomous TPG Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
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This paper introduces a new family of pseudorandom test pattern generators, namedtree-structured linear cellular automata (TLCA).The empirical study on the ISCAS'85 benchmarkcircuits shows the effectiveness of TLCA for testingsequential faults.