Integrated Diagnostics for Embedded Memory Built-in Self Test on PowerPCTM Devices

Authors:
Affiliations:
Venue:
ICCD '97 Proceedings of the 1997 International Conference on Computer Design (ICCD '97)
Year:
1997

Citing 0
Cited 5

Memory fault diagnosis by syndrome compression

Proceedings of the conference on Design, automation and test in Europe
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

Journal of Electronic Testing: Theory and Applications
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield

IEEE Design & Test
DFT Advances in Motorola's Next-Generation 74xx PowerPC" Microprocessor

ITC '00 Proceedings of the 2000 IEEE International Test Conference
DFT Advances in Motorola's MPC7400, a PowerPCTM Microprocessor

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Quantified Score

Hi-index	0.00

Visualization

Abstract

Integration of Diagnostics with a Memory Built-in Self-Test (BIST) allowing both an effective and efficient manufacturing test as well as an effective diagnostic capability is detailed. Detection of failures within a memory are the primary objective of an Embedded Memory BIST. Inclusion of comprehensive diagnostics, to isolate faults incurred during the manufacturing or design process, are an extension to the Memory BIST, further utilizing the existing circuitry and functionality. Detection and diagnosis of failures within an embedded memory can be realized throughout the entire manufacturing process.