Effective safety property checking using simulation-based sequential ATPG
Proceedings of the 39th annual Design Automation Conference
Logic verification based on diagnosis techniques
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Automated data analysis solutions to silicon debug
Proceedings of the Conference on Design, Automation and Test in Europe
Automating data analysis and acquisition setup in a silicon debug environment
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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The goal of Intelligent RAM (IRAM) is to design a cost-effective computer by designing a processor in a memory fabrication process, instead of in a conventional logic fabrication process, and include memory on-chip. To design a processor in a DRAM process ...