A Hierarchical Adaptive Distributed System-Level Diagnosis Algorithm
IEEE Transactions on Computers
Pentium Pro and Pentium II system architecture (2nd ed.)
Pentium Pro and Pentium II system architecture (2nd ed.)
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Advanced Computer Architectures
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Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
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ATS '99 Proceedings of the 8th Asian Test Symposium
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VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
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ITC '99 Proceedings of the 1999 IEEE International Test Conference
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ITC '99 Proceedings of the 1999 IEEE International Test Conference
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The paper is devoted to the problem of self-testing in system environment (field diagnosis and maintenance at the end user). It discusses test process decomposition in the context of increasing hardware complexity and proliferation of embedded DFT and BIST circuitry in the commercial off the shelve VLSI chips (COTS). Test observability is improved with the use of various on-line monitoring mechanisms. To optimize test effectiveness we use special tools based on direct and indirect fault coverage analysis.