ICCQ: A Test Method for Analogue VLSI Base On Current Monitoring

Authors:
J. P. M. Van Lammeren
Affiliations:
-
Venue:
IDDQ '97 Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
Year:
1997

Citing 0
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Abstract

This paper introduces a test method for analogue (parts of) ICs that determines whether an IC is good or not by measuring the currents flowing through its constituent circuits. The ICCQ test method is not a full functional test. It is aimed primarily at finding faulty circuits during wafer testing. Both static and dynamic currents can be tested with this test method.