XMAX: X-Tolerant Architecture for MAXimal Test Compression

Authors:
Subhasish Mitra;Kee Sup Kim
Affiliations:
-;-
Venue:
ICCD '03 Proceedings of the 21st International Conference on Computer Design
Year:
2003

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Abstract

XMAX is a novel test data compression architecture capable ofachieving almost exponential reduction in scan test data volume andtest time while allowing use of commercial Automatic Test PatternGeneration (ATPG) tools. It tolerates presence of sources ofunknown logic values (also referred to as X's) without compromisingtest quality and diagnosis capability for most practical purposes.The XMAX architecture has been implemented in several industrialdesigns.