Design for verification testability

  • Authors:
  • Andrzej Krasniewski

  • Affiliations:
  • Warsaw University of Technology, Nowowiejska 15/19,00-665 Warszawa, Poland

  • Venue:
  • EURO-DAC '90 Proceedings of the conference on European design automation
  • Year:
  • 1990

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Abstract

A procedure for designing combinational circuits suitable for built-in verification testing is presented. Unlike the traditional approach, where the design of a test pattern generator follows the functional logic synthesis, in our method the built-in self-test synthesis tightly interacts with the functional logic design. The experimental results indicate that a significant reduction in testing time at a negligible area/performance penalty can be obtained in the circuits designed using the proposed verification testing oriented logic synthesis procedure.