Minimal period retiming under process variations

Authors:
Jia Wang;Hai Zhou
Affiliations:
Northwestern University, Evanston, IL;Northwestern University, Evanston, IL
Venue:
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Year:
2004

Citing 3
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Abstract

With aggressive scaling down of feature sizes in VLSI fabrication, process variations have become a critical issue in designs. With process variations, timing optimization should consider the randomness introduced in delays. This paper considers how to retime a circuit under process variations. A statistical retiming problem is defined on the concept of a disutility function. Based on a new minimal period retiming algorithm, two algorithms are presented for the statistical retiming problem. Both theoretical and experimental results are given.