Pseudo Random Patterns Using Markov Sources for Scan BIST
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Evolutionary Optimization in Code-Based Test Compression
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.00 |