An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation

Authors:
Haijun Sun;Yongjia Zeng;Pu Li;Shaochong Lei;Zhibiao Shao
Affiliations:
School of Information Engineering, Zhengzhou University, Zhengzhou, China 450001;Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049;Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049;Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049;Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2011

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Abstract

This paper presents a novel seed-based test pattern generator (SB-TPG). The core of SB-TPG is a seed sequence generator. A coverage-driven seed generation algorithm has been proposed to generate the optimized seeds. The test sequence generated by SB-TPG is a single input change (SIC) sequence that can significantly reduce test power for test-per-clock built-in self-test (BIST). Further, seed-masking technique has been put forward to filter those power-consuming seeds, thus reducing test power for test-per-scan BIST. Experimental results show that SB-TPG can achieve high fault coverage with short test length, low power and small hardware overhead.