System-on-a-Chip: Design and Test
System-on-a-Chip: Design and Test
How we test Siemens Embedded DRAM Cores
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test and repair of large embedded DRAMs. I
Proceedings of the IEEE International Test Conference 2001
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
A Built-In Self-Repair Analyzer (CRESTA) for embedded DRAMs
ITC '00 Proceedings of the 2000 IEEE International Test Conference
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Modern SoC Design for high-volume products requires a strong focus on Design-for-Test and Design-for-Manufacturability. We present a case study of an SoC test concept, including a description of the DfT and DfM features included in the SoC device and a brief motivation for their utility.