A Functional Testing Method for Microprocessors
IEEE Transactions on Computers
Designing an Alpha Microprocessor
Computer
Alpha 21164 Manufacturing Test Development and Coverage Analysis
IEEE Design & Test
Functional Testing of Current Microprocessors (applied to the Intel i860TM)
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Testing diagnostics of modern microprocessors with the use of functional models
Automation and Remote Control
| Hi-index | 0.00 |
The well-known models and concepts of functional testing of microprocessors are described. The properties of the RISC-architecture that aid in applying effective approaches to hardware testing are stated. Functional decomposition is used to develop a sequence of actions implemented in designing tests. Special attention is paid to testing of control units. The RISC-architecture has shown to be helpful in designing effective algorithms for testing at the architectural level. The designed procedures detect most of the defects in control circuits indirectly through data processing and storing devices without the use of control units.