Test Generation and Fault Localization for Quantum Circuits

Authors:
Marek Perkowski;Jacob Biamonte;Martin Lukac
Affiliations:
Portland State University, Portland, OR;Portland State University, Portland, OR;Portland State University, Portland, OR
Venue:
ISMVL '05 Proceedings of the 35th International Symposium on Multiple-Valued Logic
Year:
2005

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Abstract

It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.