Coverage of Formal Properties Based on a High-Level Fault Model and Functional ATPG

  • Authors:
  • Franco Fummi;Graziano Pravadelli;Franco Toto

  • Affiliations:
  • Università di Verona;Università di Verona;STMicroelectronics

  • Venue:
  • ETS '05 Proceedings of the 10th IEEE European Symposium on Test
  • Year:
  • 2005

Quantified Score

Hi-index 0.00

Visualization

Abstract

The use of model checking to validate descriptions of digital systems lacks a coverage metrics. If the set of formal properties defined to prove the correctness of the design is incomplete, the verification can lead to a false sense of security. This paper refines, extends, and compares with other symbolic approaches, a methodology to estimate the incompleteness of formal properties, which exploits a high-level fault model and functional ATPG.